Test Frequency Selection Using Particle Swarm Optimization
Zdenek Kincl, Zdenek Kolka
DOI: 10.15598/aeee.v11i6.912
Abstract
The paper deals with the problem of test frequency selection for multi-frequency parametric fault diagnosis of analog linear circuits. An appropriate set of test frequencies is determined by minimizing the conditionality of the sensitivity matrix based on the system of fault equations using a global stochastic optimization. A novel method based on the Particle Swarm Optimization, which provides more accurate results and improves the convergence rate, is described. The paper provides several practical examples of its application to test frequency selection for active RC filters. A comparison of the results obtained by the proposed method and by the Genetic Algorithm is also presented.