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Brno University of Technology, Czech Republic

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National Taiwan University of Science and Technology, Taiwan, Province of China

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VSB - Technical University of Ostrava, Czech Republic

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Hongik University, Korea

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VSB - Technical University of Ostrava, Czech Republic

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Wroclaw University of Science and Technology, Poland

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Technical University of Cluj Napoca, Romania

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Posts and Telecommunications Institute of Technology, Ho Chi Minh City, Vietnam

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Henan Polytechnic University, China

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Ton Duc Thang University, Vietnam

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University of Pardubice, Czech Republic

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Delhi Technological University, India

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Ho Chi Minh City University of Technology and Education, Vietnam

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DIMES Department of University of Calabria, Italy

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Henan Polytechnic University, China

Nguyen Quang Sang
Ho Chi Minh City University of Transport, Vietnam

Anh-Tu Le
Ho Chi Minh City University of Transport, Vietnam

Phu Tran Tin
Ton Duc Thang University, Vietnam


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Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

Dinara Sobola, Stefan Talu, Petr Sadovsky, Nikola Papez, Lubomir Grmela

DOI: 10.15598/aeee.v15i3.2242


Abstract

The wings scales of the butterflies were studied by Atomic Force Microscopy (AFM) in the air. Measurements were done without special preparation of species in order to observe the surface in real conditions. The data of probe microscopy (figures) confirm AFM to be a powerful technique for determining features of the insects' wings. These features play a key role in optical phenomena which makes fascinating wings coloration. The structure determines light reflection, propagation, and diffraction. AFM imaging was done at the areas of specific colors without scale separation.

Keywords


Atomic force microscopy; diffraction grating; fractal analysis; structural coloration; wing surface.

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